EDEM Research Spotlight- Discrete Element Method Model of the Wheat Flour Sifting Process
Altair Employee- RESEARCHER
- Kaliramesh Siliveru
- INSTITUTE
- Kansas State University, United States
- DEPARTMENT
- Grain Science and Industry
- SUPERVISOR
- Dr. Kingsly Ambrose
- TIMELINE
- 15/03/15 - 12/12/16
The objective of this research is to develop a DEM model of the wheat flour sifting process to predict the particle size distribution based on the physical and surface characteristics of the incoming wheat flour particles, to help in the optimization of the current sifting process during wheat milling. In the present study, EDEM software is used to simulate the sieving process, by simulating the sifter geometry, sifter movement and the inter-particle cohesion during the size separation process. The findings from the current model would eventually be instrumental in optimizing the sifting time and increasing the sifter efficiency during the wheat milling process.
Fig. 1. Snapshot of oversize particles
Fig. 2. Illustration of particle attachment
DEM has allowed us to understand the particle movement inside the sifter and on the screen surface, which has enabled us to understand the concept of sieve blinding and percolation phenomenon. I would like to take this as an opportunity to thank the EDEM support team for their immense help extended to me.
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