De-embedding S-Parameters in Waveguides for Material Parameter Extraction

Saranraj Karuppuswami_21591
Saranraj Karuppuswami_21591 New Altair Community Member
edited December 2021 in Altair HyperWorks

One of the vital tasks while computing S-Parameters for material characterization of a sample placed inside the waveguide is to de-embed the S-parameters to the edges of the sample. This can be performed by scaling the S-Parameters appropriately. 

Consider a X-band waveguide: a = 22.86 mm & b = 10.16 mm (WR-90) as shown in figure below.

image

Let a sample of thickness 'd' be placed in the cross section of the waveguide at a distance of 'image' as shown in Figure below.

image

The S-Parameters at the edge of the port are given by

image

The reference simulation plane should be shifted from the port to the sample edge (as indicated by the red-line in the figure below) such that the effect of the empty waveguide sections are removed and the s-parameters represent just the unknown sample.


image

The process of de-embedding involves scaling the s-parameters appropriately. To do that, let us consider the standard s-parameter equations as below.

image

where,

image 

The scaling is performed a follows.

image

The de-embedded s-parameters can now be used directly for material characterization using standard extraction techniques such as Nicolson-Ross-Weir.

In Feko, one can use the Post Feko scripting or mathematical equations to achieve the de-embedded s-parameters from a full waveguide simulation. 


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